Testing Services

As part of the commitment to serve customers better, AMF is expanding testing capabilities and consolidating customer’s “one shop floor” experience. Our enhanced testing infrastructure provides an end-to-end solution to ensure customers receive thoroughly tested silicon photonics devices, without increasing time-to-market.

Inline Wafer Level Testing

  • Inline Testing
  • Wafer Level
  • Optical Testing
  • Grating Coupling
  • C-band Light Source
  • Electrical Testing
  • DC Testing (only)

Photonics Wafer Level Testing

  • Post Fabrication
  • Wafer Level
  • Grating Coupling
  • Edge Coupling
  • C-/O-band Light Source
  • Electrical Testing
  • DC/RF Testing
  • O/E Testing

Chip Edge Coupling Tester

  • After Dicing
  • Chip Level
  • Optical Testing
  • Edge Coupling
  • C-/O-band Light Source
  • Electrical Testing
  • DC/RF Testing
  • O/E Testing

Chip Grating Coupling Tester

  • After Dicing
  • Chip Level
  • Optical Testing
  • Grating Coupling
  • C-/O-band Light Source
  • Electrical Testing
  • DC/RF Testing
  • O/E Testing

Contact us for more details in AMF’s testing services.