Testing Services
As part of the commitment to serve customers better, AMF is expanding testing capabilities and consolidating customer’s “one shop floor” experience. Our enhanced testing infrastructure provides an end-to-end solution to ensure customers receive thoroughly tested silicon photonics devices, without increasing time-to-market.
Inline Wafer Level Testing
- Inline Testing
- Wafer Level
- Optical Testing
- Grating Coupling
- C-band Light Source
- Electrical Testing
- DC Testing (only)
Photonics Wafer Level Testing
- Post Fabrication
- Wafer Level
- Grating Coupling
- Edge Coupling
- C-/O-band Light Source
- Electrical Testing
- DC/RF Testing
- O/E Testing
Chip Edge Coupling Tester
- After Dicing
- Chip Level
- Optical Testing
- Edge Coupling
- C-/O-band Light Source
- Electrical Testing
- DC/RF Testing
- O/E Testing
Chip Grating Coupling Tester
- After Dicing
- Chip Level
- Optical Testing
- Grating Coupling
- C-/O-band Light Source
- Electrical Testing
- DC/RF Testing
- O/E Testing
Contact us for more details in AMF’s testing services.